• DocumentCode
    3492403
  • Title

    Subwavelength-resolution imaging device based on frequency scanning

  • Author

    Maslovski, Stanislav ; Alitalo, Pekka ; Tretyakov, Sergei

  • Author_Institution
    St. Petersburg State Tech. Univ., St. Petersburg
  • fYear
    2008
  • fDate
    16-20 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new principle of microwave, millimeter wave, and optical subwavelength imaging based on frequency scanning is described. The role of the imaging device ldquosensorrdquo is played by one or several electrically dense arrays of subwavelength-sized resonant particles. The array is illuminated by a probe electromagnetic wave whose frequency scans over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field behind the array at one or at most two points. After the scan the spatial distribution of the near field in the array plane can be reconstructed with simple post-processing. Due to the resonant response of the array, the proposed device enhances evanescent fields created by imaging objects, which makes it is similar to super-lenses based on the use of metamaterials.
  • Keywords
    image reconstruction; image sensors; metamaterials; electromagnetic wave; evanescent fields; frequency scanning; imaging device sensor; metamaterials; optical subwavelength imaging; resonating array modes; subwavelength-sized resonant particles; superlenses; Electromagnetic measurements; Electromagnetic scattering; Frequency; Image reconstruction; Microwave devices; Microwave imaging; Optical imaging; Optical surface waves; Probes; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. APMC 2008. Asia-Pacific
  • Conference_Location
    Macau
  • Print_ISBN
    978-1-4244-2641-6
  • Electronic_ISBN
    978-1-4244-2642-3
  • Type

    conf

  • DOI
    10.1109/APMC.2008.4958611
  • Filename
    4958611