DocumentCode
3492403
Title
Subwavelength-resolution imaging device based on frequency scanning
Author
Maslovski, Stanislav ; Alitalo, Pekka ; Tretyakov, Sergei
Author_Institution
St. Petersburg State Tech. Univ., St. Petersburg
fYear
2008
fDate
16-20 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
A new principle of microwave, millimeter wave, and optical subwavelength imaging based on frequency scanning is described. The role of the imaging device ldquosensorrdquo is played by one or several electrically dense arrays of subwavelength-sized resonant particles. The array is illuminated by a probe electromagnetic wave whose frequency scans over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field behind the array at one or at most two points. After the scan the spatial distribution of the near field in the array plane can be reconstructed with simple post-processing. Due to the resonant response of the array, the proposed device enhances evanescent fields created by imaging objects, which makes it is similar to super-lenses based on the use of metamaterials.
Keywords
image reconstruction; image sensors; metamaterials; electromagnetic wave; evanescent fields; frequency scanning; imaging device sensor; metamaterials; optical subwavelength imaging; resonating array modes; subwavelength-sized resonant particles; superlenses; Electromagnetic measurements; Electromagnetic scattering; Frequency; Image reconstruction; Microwave devices; Microwave imaging; Optical imaging; Optical surface waves; Probes; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location
Macau
Print_ISBN
978-1-4244-2641-6
Electronic_ISBN
978-1-4244-2642-3
Type
conf
DOI
10.1109/APMC.2008.4958611
Filename
4958611
Link To Document