DocumentCode
349440
Title
Conversion electron Mossbauer spectroscopy (CEMS) and X-ray diffraction studies of 40 keV He-irradiated SUS304 austenitic stainless steel
Author
Toriyama, T. ; Ishibashi, T. ; Hayashi, N. ; Sakamoto, I. ; Nishio, K. ; Wakabayashi, H. ; Iijima, H.
Author_Institution
Atomic Energy Eng., Musashi Inst. of Technol., Tokyo, Japan
Volume
2
fYear
1999
fDate
36495
Firstpage
783
Abstract
In order to elucidate the martensitic transformation process induced by He gas accumulated in SUS304 austenitic stainless steel, the relationship between the hyperfine parameters for the austenitic phase and the induced martensitic phase and He-ion fluence for He-irradiated steel samples was investigated using Conversion Electron Mossbauer Spectroscopy. The changes of lattice constant for austenitic and induced martensitic phases were also investigated using X-ray diffraction. The samples were irradiated by 40 keV He ions at fluences of 3.6×10 17, 7.2×1017 and 10.8×1017 ions/cm2 at a temperature of 70°C. We have found that the hyperfine field and lattice constant of the induced martensitic phase are both slightly larger than those for the martensitic phase formed by rolling. An austenitic phase modified by He irradiation has also been formed; the lattice constant of the modified austenitic phase is by about 0.5% larger than that of unirradiated austenitic phase, which may suggest the formation of a precursor preceding the martensitic transformation induced by He bubbles
Keywords
Mossbauer effect; austenitic stainless steel; bubbles; conversion electron spectra; hyperfine interactions; ion beam effects; martensitic transformations; 40 keV; 70 degC; He bubbles; He-ion fluence; He-irradiated steel samples; SUS304 austenitic stainless steel; X-ray diffraction; austenitic phase; conversion electron Mossbauer spectroscopy; hyperfine field; induced martensitic phase; lattice constant; martensitic transformation; Electrons; Helium; Iron; Lattices; Magnetic materials; Neutrons; Steel; Superconducting materials; Temperature; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location
Kyoto
Print_ISBN
0-7803-4538-X
Type
conf
DOI
10.1109/IIT.1998.813784
Filename
813784
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