• DocumentCode
    3494804
  • Title

    Numerical reflection of evanescent waves from perfectly matched layers

  • Author

    Berenger, J.-P.

  • Author_Institution
    Centre d´Anal. de Defense, Arcueil, France
  • Volume
    3
  • fYear
    1997
  • fDate
    13-18 July 1997
  • Firstpage
    1888
  • Abstract
    Berenger (see IEEE Ant. and Propag., vol.44, no.1, p.110-17, 1996) found the conditions to be satisfied by a perfectly matched layer (PML) located close to scattering structures so as to make the numerical reflection negligible. This analysis was mainly based on numerical experiments. Since then, other authors have investigated the problem of numerical reflection from a theoretical point of view. De Moerloose and Stuchly (see IEEE Micr., and Guid. Wav. Letters, vol.5, no.10, p.344-6, 1995) considered the reflection of evanescent waves from PMLs bounding waveguides. Starting from De Moerloose et al. proposals, we investigated the propagation of general evanescent waves in a PML, along with the numerical reflection of such waves from PML interfaces. From this theory, the observations of Berenger can be clearly interpreted. The numerical reflection is due to strongly evanescent waves that are totally reflected below a cutoff frequency which is exactly the cutoff empirically found by Berenger.
  • Keywords
    electromagnetic wave propagation; electromagnetic wave reflection; electromagnetic wave scattering; finite difference time-domain analysis; waveguides; EM wave absorption; FDTD; PML interfaces; bounding waveguides; cutoff frequency; evanescent waves propagation; numerical experiments; numerical reflection; perfectly matched layers; scattering structures; Absorption; Cutoff frequency; Electrooptical waveguides; Equations; Finite difference methods; Perfectly matched layers; Reflection; Scattering; Tellurium; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
  • Conference_Location
    Montreal, Quebec, Canada
  • Print_ISBN
    0-7803-4178-3
  • Type

    conf

  • DOI
    10.1109/APS.1997.631640
  • Filename
    631640