DocumentCode
3496912
Title
Simulation of resonant tunneling structures: Origin of the I-V multi-peak and plateau-like behaviour
Author
Wen, J. ; Weng, Q.C. ; Li, L. ; Xiong, D.Y.
Author_Institution
Key Lab. of Polar Mater. & Devices, East China Normal Univ., Shanghai, China
fYear
2012
fDate
28-31 Aug. 2012
Firstpage
61
Lastpage
62
Abstract
Plateau-like behavior and multi-peak of the I-V curves of an AlAs/GaAs/AlAs double-barrier resonant tunneling diode combined with a layer of InAs QDs (QD-RTD) are simulated. Our simulation results show that the coupling between the energy level in the emitter QW (QD) and that in the central quantum well is the key point in understanding the origin of the I-V multi-peak and plateau-like structure. The embedded designed QD layer at the emitter spacer can enhance this effect. The effects of device temperature on the I-V characteristics are obtained. Our results provide the physical basis for understanding and utilizing the plateau-like behavior of I-V curves in designing resonant tunneling devices.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; resonant tunnelling diodes; semiconductor quantum dots; AlAs-GaAs-AlAs; I-V curves; central quantum well; double barrier resonant tunneling diode; emitter QW; emitter spacer; energy level; plateau like behaviour; quantum dots; resonant tunneling structures; Charge carrier density; Couplings; Current density; Gallium arsenide; Resonant tunneling devices; Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2012 12th International Conference on
Conference_Location
Shanghai
ISSN
2158-3234
Print_ISBN
978-1-4673-1602-6
Type
conf
DOI
10.1109/NUSOD.2012.6316507
Filename
6316507
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