A technique for fast AC statistical analysis of analog circuits

Techniques are presented to evaluate mean values and standard deviations of a set of AC analog cell specifications under random fluctuations of the primitive component parameters. These techniques complement those which were presented for statistical analysis of operating points and DC large-signal characteristics. Their precision and generality are similar to those of Monte Carlo analysis of electrical simulations, while the CPU time is considerably smaller. We include results for a fully-differential OTA to show the advantages of the proposed techniques as compared to the said Monte Carlo analysis as well as to other tools for rapid statistical evaluation