DocumentCode
3497781
Title
Rigid and competitive fault tolerance for logical information structures in networks
Author
Chechik, Shiri ; Peleg, David
Author_Institution
Weizmann Inst. of Sci., Rehovot, Israel
fYear
2010
fDate
17-20 Nov. 2010
Abstract
Consider a logical structure S constructed over a given network G and possessing certain properties specified by a requirement predicate P(S´, G). Consider a failure event involving a set F of disconnected edges or crashed vertices. The paper deals with making S fault-tolerant, i.e., ensuring that after the failure event, the surviving structure S´ = SF continues to satisfy V. This requirement for fault-tolerance can be interpreted in two different ways. Rigid fault-tolerance means that after the failure event F, we insist on imposing on the surviving structure S´ the requirements of V with respect to the original network G, i.e., demanding that S´ satisfies the predicate P(S´, G). Alternatively, competitive fault tolerance involves evaluating the performance of the surviving S´ with respect to the surviving network G´ = G F, i.e., requiring that subsequent to the failure event F, the surviving S´ satisfies P(S´, G´). The paper introduces the distinction between rigid and competitive fault tolerance in network structures, and explores this distinction through studying MST structures, connectivity structures and flow structures. In particular, necessary and sufficient conditions are established for the existence of rigid fault tolerant structures, and constructions are presented for both types of structures.
Keywords
fault tolerant computing; network theory (graphs); tree data structures; competitive fault tolerance; logical information structure; network structure; rigid tolerance; Data structures; Distributed computing; Euclidean distance; Fault tolerance; Fault tolerant systems; Resilience; Routing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Electronics Engineers in Israel (IEEEI), 2010 IEEE 26th Convention of
Conference_Location
Eliat
Print_ISBN
978-1-4244-8681-6
Type
conf
DOI
10.1109/EEEI.2010.5662210
Filename
5662210
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