• DocumentCode
    3498878
  • Title

    Monitoring glass transition of epoxy encapsulant using thermal analysis techniques

  • Author

    Chew, Spencer ; Lim, Edward

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    1996
  • fDate
    26-28 Nov 1996
  • Firstpage
    266
  • Lastpage
    271
  • Abstract
    Glass transition temperature, better known by the acronym Tg in the electronic industry, is a frequently used parameter to depict the degree of cure of epoxy encapsulant. Tg can be measured by a variety of thermal analysis techniques and often vary as the optimised conditions differ between the different techniques. This paper investigates and reports the glass transition temperature range of a cured epoxy encapsulant using differential scanning calorimetry, thermomechanical analysis and dynamic mechanical analysis
  • Keywords
    encapsulation; glass transition; polymers; thermal analysis; differential scanning calorimetry; dynamic mechanical analysis; epoxy encapsulant; glass transition; thermal analysis; thermomechanical analysis; Calorimetry; Dielectric loss measurement; Dielectric measurements; Electronics industry; Glass; Loss measurement; Mechanical variables measurement; Monitoring; Permittivity measurement; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
  • Conference_Location
    Penang
  • Print_ISBN
    0-7803-3388-8
  • Type

    conf

  • DOI
    10.1109/SMELEC.1996.616495
  • Filename
    616495