• DocumentCode
    3499125
  • Title

    Improving validation coverage metrics to account for limited observability

  • Author

    Lisherness, Peter ; Cheng, Kwang-Ting Tim

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
  • fYear
    2012
  • fDate
    Jan. 30 2012-Feb. 2 2012
  • Firstpage
    292
  • Lastpage
    297
  • Abstract
    In both pre-silicon and post-silicon validation, the detection of design errors requires both stimulus capable of activating the errors and checkers capable of detecting the behavior as erroneous. Most functional and code coverage metrics evaluate only the activation component of the testbench and ignore propagation and detection. In this paper, we summarize our recent work in developing improved metrics that account for propagation and/or detection of design errors. These works include tools for observability-enhanced code coverage and mutation analysis of high-level designs as well as an analytical method, Coverage Discounting, which adds checker sensitivity to arbitrary functional coverage metrics.
  • Keywords
    high level synthesis; observability; program compilers; program debugging; program testing; program verification; activation component; arbitrary functional coverage metrics; behavior detection; checker sensitivity; code coverage metrics; coverage discounting; design errors; functional metrics; high-level designs; limited observability; mutation analysis; observability-enhanced code coverage; post-silicon validation; pre-silicon validation; testbench; validation coverage metrics; Adaptation models; Analytical models; Logic gates; Measurement; Observability; Runtime; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
  • Conference_Location
    Sydney, NSW
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-0770-3
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2012.6164962
  • Filename
    6164962