DocumentCode
3499125
Title
Improving validation coverage metrics to account for limited observability
Author
Lisherness, Peter ; Cheng, Kwang-Ting Tim
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
fYear
2012
fDate
Jan. 30 2012-Feb. 2 2012
Firstpage
292
Lastpage
297
Abstract
In both pre-silicon and post-silicon validation, the detection of design errors requires both stimulus capable of activating the errors and checkers capable of detecting the behavior as erroneous. Most functional and code coverage metrics evaluate only the activation component of the testbench and ignore propagation and detection. In this paper, we summarize our recent work in developing improved metrics that account for propagation and/or detection of design errors. These works include tools for observability-enhanced code coverage and mutation analysis of high-level designs as well as an analytical method, Coverage Discounting, which adds checker sensitivity to arbitrary functional coverage metrics.
Keywords
high level synthesis; observability; program compilers; program debugging; program testing; program verification; activation component; arbitrary functional coverage metrics; behavior detection; checker sensitivity; code coverage metrics; coverage discounting; design errors; functional metrics; high-level designs; limited observability; mutation analysis; observability-enhanced code coverage; post-silicon validation; pre-silicon validation; testbench; validation coverage metrics; Adaptation models; Analytical models; Logic gates; Measurement; Observability; Runtime; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
Conference_Location
Sydney, NSW
ISSN
2153-6961
Print_ISBN
978-1-4673-0770-3
Type
conf
DOI
10.1109/ASPDAC.2012.6164962
Filename
6164962
Link To Document