• DocumentCode
    3499378
  • Title

    Compact Modeling of High Frequency Correlated Noise in HBTs

  • Author

    Sakalas, P. ; Herricht, J. ; Chakravorty, A. ; Schroter, M.

  • fYear
    2006
  • fDate
    8-10 Oct. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A compact model solution, consistent with the system theory for correlated base and collector shot noise sources, is derived and implemented in the bipolar transistor model HICUM using Verilog-A. Compiled (with Tiburon) Verilog-A model is simulated using ADS 2004A and the results are tested against measured noise parameters for high-frequency (fT at 150 GHz) SiGe HBTs. Very good agreement between simulated and measured data is obtained
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; semiconductor device models; semiconductor device noise; HICUM; SiGe; Verilog-A; correlation; heterojunction bipolar transistors; noise modeling; shot noise; Bipolar transistors; Circuit noise; Circuit simulation; Computational modeling; Frequency; Germanium silicon alloys; Hardware design languages; Integrated circuit noise; Low-frequency noise; Silicon germanium; HICUM; Noise; SiGe Heterojunction bipolar transistors; Verilog-A; correlation; noise modeling; shot noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2006
  • Conference_Location
    Maastricht
  • ISSN
    1088-9299
  • Print_ISBN
    1-4244-0458-4
  • Electronic_ISBN
    1088-9299
  • Type

    conf

  • DOI
    10.1109/BIPOL.2006.311175
  • Filename
    4100243
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3499378