DocumentCode
350206
Title
Delay characteristics of surface charging on a cylindrical insulator in vacuum
Author
Yamamoto, O. ; Takuma, T. ; Hamada, S. ; Tanabe, Y. ; Kakehashi, Y. ; Ikoma, S. ; Nishimura, K.
Author_Institution
Kyoto Univ., Japan
Volume
3
fYear
1999
fDate
1999
Firstpage
341
Abstract
The charging of an insulator is considered as a critical phenomenon leading a bridged gap to flashover in vacuum. Based on the theory which Harmisch and Boersch (1963) proposed as secondary emission electron avalanche (SEEA) mechanism, Anderson (1980) explained the V-t characteristic of a bridged vacuum gap exposed to a short voltage pulse in connection with space charge effects due to ionization of desorbed gases in vacuum. In this theory, however, it is assumed that the charging takes place immediately after the voltage application, thereby neglecting the time necessary for the surface. charging. We have developed a probe method which enables us to do a real-time observation of the surface charging in vacuum. The probe measures the electric field change associated with the surface charging on the cathode very close to the triple junction, where the insulator, cathode and vacuum meet, without disturbing the electric field in the gap nor the charge distribution on the insulator. This paper reports the results of probe measurement which characterize temporal behavior of charging on a cylindrical insulator when it is exposed to a trapezoidal or a stepped DC voltage
Keywords
vacuum insulation; PMMA insulator; V-t characteristic; bridged vacuum gap; cathode; cylindrical insulator; delay characteristics; desorbed gases ionisation; electric field change measurement; flashover; insulator; probe method; real-time observation; secondary emission electron avalanche; short voltage pulse; space charge effects; stepped DC voltage; surface charging; trapezoidal voltage; triple junction; vacuum;
fLanguage
English
Publisher
iet
Conference_Titel
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location
London
ISSN
0537-9989
Print_ISBN
0-85296-719-5
Type
conf
DOI
10.1049/cp:19990769
Filename
816790
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