• DocumentCode
    3504017
  • Title

    Stability study of thick-film pressure sensor on steel substrate

  • Author

    Zongyang Zhang ; Xingguo Cheng ; Run Chen ; Xiaojie Chen ; Sheng Liu

  • Author_Institution
    State Key Lab. for Digital Manuf. Equip. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    625
  • Lastpage
    629
  • Abstract
    Thick-film pressure sensors on steel substrate are proven to be robust and low cost, and can be used in many fields such as automotive industries, oil industries and military sectors. In this paper, finite element method (FEM) was used to evaluate residual thermal stresses and the self-heating of the thick film resistors (TFRs) on the offset voltage of the sensor. Results show that the residual stresses will affect the sensor output stability and accelerate the failure of dielectrics on steel substrate. The effects of self-heating of TFRs on the offset voltage can be negligible. Certain accelerated environmental tests are used to evaluate the robustness, stability of the sensors. Results show that the sensors have a stable output at constant temperature of 25°C. Most sensors have a small offset change after thermal cycling. Although some sensors have a relatively large zero drift after thermal cycling, and this drift can be relieved by appropriate heat treatment. Finally, thermal shock test and drop test have verified the robust bonding between the dielectrics and the steel substrate.
  • Keywords
    circuit stability; dielectric devices; failure analysis; finite element analysis; heat treatment; integrated circuit bonding; integrated circuit testing; life testing; pressure sensors; steel; thermal management (packaging); thermal shock; thermal stresses; thick film resistors; FEM; TFR; accelerated environmental test; dielectrics; drop test; failure; finite element method; heat treatment; offset voltage; residual thermal stress; robust bonding; self-heating; sensor output stability; steel substrate; temperature 25 C; thermal cycling; thermal shock test; thick film resistor; thick-film pressure sensor; zero drift; Abstracts; Copper; Educational institutions; Heating; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474695
  • Filename
    6474695