• DocumentCode
    3506316
  • Title

    Photosensitivity of electron field emission from B-doped Si-tip arrays

  • Author

    Bornmann, B. ; Mingels, S. ; Serbun, P. ; Lützenkirchen-Hecht, D. ; Müller, G. ; Prommesberger, C. ; Langer, C. ; Dams, F. ; Schreiner, R.

  • Author_Institution
    FB C Phys. Dept., Univ. of Wuppertal, Wuppertal, Germany
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The electron current from field-emitting B-doped Si-tip arrays under illumination was studied. An improved cathode design with a patch of 271 tips yielded a reproducible cathode current between 0.2-2000 nA in the electric field range of 3.8-6.6 V/μm. The plateau in the Fowler-Nordheim plot shows the actual carrier depletion and leads to a very stable emission at ~1 μA with a current noise of less than 3.3 %. Color-filtered halogen lamp illumination was used to investigate the photo-sensitivity of the saturation current. The intensity-normalized current switching ratio increases nonlinearly with the photon energy. This hints either for secondary generation in the conduction band or deeper valence band excitation. The first is supported by a rough estimation of the quantum efficiency. Further experiments with a tunable laser and electron spectroscopy are planned.
  • Keywords
    boron; electron field emission; electron spectroscopy; elemental semiconductors; halogens; lamps; lighting; silicon; valence bands; B-doped Si-tip arrays; Fowler-Nordheim plot; Si:B; actual carrier depletion; cathode design improvement; color-filtered halogen lamp illumination; conduction band; current 0.2 nA to 2000 nA; current noise; deeper valence band excitation; electron field emission; electron spectroscopy; intensity-normalized current switching ratio; photosensitivity; quantum efficiency; rough estimation; saturation current; tunable laser; Cathodes; Iron; Lighting; Photonics; Silicon; Spectroscopy; Switches; field emitter arrays; p-doped Si tips; photosensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316980
  • Filename
    6316980