• DocumentCode
    3506995
  • Title

    Study of optimized deposition of thin film in DC magnetron sputtering and measuring the surface conductivity by four point probe and Hall effect

  • Author

    Mahmoudzadeh, Mahdi ; Bahadori, F. ; Ghoranneviss, Mahmood

  • Author_Institution
    Plasma Phys. Res. Lab., Tehran, Iran
  • fYear
    2004
  • fDate
    1-1 July 2004
  • Firstpage
    302
  • Abstract
    Summary form only given. In our investigation thin films of copper and brass were prepared by DC magnetron sputtering and coated on flat glasses. The effect of the thickness of brass and copper on electrical and optical properties was studied. The result shows that the resistively of thin films is a function of applied voltage. Furthermore it shows that the decrease in resistively with increased thickness is due to an increase in carrier concentration with increased film thickness.
  • Keywords
    Hall effect; brass; carrier density; copper; electrical resistivity; metallic thin films; sputter deposition; sputtered coatings; surface conductivity; Cu; CuZn; DC magnetron sputtering; Hall effect; brass; carrier concentration; copper; electrical properties; flat glass; four point probe; optical properties; surface conductivity; thin film deposition; Conductivity measurement; Copper; Glass; Hall effect; Optical films; Physics; Plasma measurements; Plasma properties; Probes; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-8334-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.2004.1339979
  • Filename
    1339979