• DocumentCode
    3507215
  • Title

    EMC behavior of static converters thanks to radiated field modeling using an equivalent electrical circuit

  • Author

    Aime, Jérémie ; Ardon, Vincent ; Clavel, Edith ; Roudet, James ; Loizelet, Philippe

  • Author_Institution
    Grenoble Electr. Eng. Lab. (G2ELAB), UJF, Grenoble, France
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    4104
  • Lastpage
    4109
  • Abstract
    Concerning power electronics converters, due to frequency and/or power rising, EMC constraints become more and more important for industrials and compliance with standards is not guarantee. In consequence, anticipation becomes a key word for engineers and the conception using computer aided design tools is actually more suitable. That is why, nowadays, efforts are focused on model developments. Unfortunately, modeling methods are limited by the complexity of industrial products. This complexity is due to the geometries with arbitrary shapes and to the nature of associated components (magnetic or not). This paper presents the EMC modeling of static converters with an application to a variable speed drive using integral methods. PEEC, AMLFMM methods and a circuit simulator are combined to compute the differential and common mode sources and finally the emitted field.
  • Keywords
    equivalent circuits; power convertors; power electronics; variable speed drives; AMLFMM methods; PEEC methods; adaptative multi-level fast multipole method; equivalent electrical circuit; integral methods; partial element equivalent circuit method; power electronics converters; radiated field modeling; static converters; variable speed drive; Circuits; Design engineering; Electrical products industry; Electromagnetic compatibility; Electronics industry; Frequency conversion; Geometry; Power electronics; Power engineering and energy; Power engineering computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5415097
  • Filename
    5415097