DocumentCode
3507556
Title
Patterned cells for phase change memories
Author
Jiang, Anxiao ; Zhou, Hongchao ; Wang, Zhiying ; Bruck, Jehoshua
Author_Institution
Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
fYear
2011
fDate
July 31 2011-Aug. 5 2011
Firstpage
2333
Lastpage
2337
Abstract
Phase-change memory (PCM) is an emerging nonvolatile memory technology that promises very high performance. It currently uses discrete cell levels to represent data, controlled by a single amorphous/crystalline domain in a cell. To improve data density, more levels per cell are needed. There exist a number of challenges, including cell programming noise, drifting of cell levels, and the high power requirement for cell programming. In this paper, we present a new cell structure called patterned cell, and explore its data representation schemes. Multiple domains per cell are used, and their connectivity is used to store data. We analyze its storage capacity, and study its error-correction capability and the construction of error-control codes.
Keywords
error correction codes; phase change memories; cell level; cell programming noise; crystalline domain; data density; data representation; discrete cell level; error-control code; error-correction capability; high power requirement; nonvolatile memory technology; patterned cell; phase change memory; Arrays; Electrodes; Phase change materials; Programming; Resistance; Tiles; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location
St. Petersburg
ISSN
2157-8095
Print_ISBN
978-1-4577-0596-0
Electronic_ISBN
2157-8095
Type
conf
DOI
10.1109/ISIT.2011.6033979
Filename
6033979
Link To Document