• DocumentCode
    3508930
  • Title

    Registration of images with topological change via riemannian embedding

  • Author

    Li, Xiaoxing ; Long, Xiaojing ; Wyatt, Christopher

  • Author_Institution
    GE Global Res., One Res. Circle, Niskayuna, NY, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1247
  • Lastpage
    1252
  • Abstract
    In this paper, we develop a new deformable registration algorithm for images with pathology-induced topological changes. In this algorithm, 3D images are embedded as 4D surfaces in a Riemannian space and the registration is conducted as a surface evolution process. Our algorithm differs from existing methods in the sense that it takes an a-priori estimation of areas with topological change as an additional input and generates dense deformation vector fields which are free of false deformation. In particular, the output of our algorithm is composed of a diffeomorphic deformation field and an intensity displacement which corrects the intensity difference caused by the topological changes. The experiments demonstrate that our proposed algorithm is capable of accurately registering images with considerable topological changes. More importantly, the resulting deformation field is not impacted by topological changes, i.e., there is no false deformation.
  • Keywords
    biomedical MRI; brain; deformation; diseases; image registration; medical image processing; topology; 3D images; Riemannian embedding; deformable registration algorithm; dense deformation vector fields; diffeomorphic deformation field; image registration; intensity displacement; pathology-induced topological changes; surface evolution process; topological change; Computational modeling; Equations; Lesions; Magnetic resonance imaging; Measurement; Registers; Riemannian embedding; brain MRI; deformable registration; false deformation; topological change;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872628
  • Filename
    5872628