• DocumentCode
    3509354
  • Title

    Trace driven registration of neuron confocal microscopy stacks

  • Author

    Hogrebe, Luke ; Paiva, Antonio R C ; Jurrus, Elizabeth ; Christensen, Cameron ; Bridge, Michael ; Korenberg, J.R. ; Tasdizen, Tolga

  • Author_Institution
    Sci. Comput. & Imaging Inst., Univ. of Utah, Salt Lake City, UT, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1345
  • Lastpage
    1348
  • Abstract
    Active research in the area of 3-D neurite tracing has predominantly focused on single sections. Ultimately, however, neurobiologists desire to study the long range connectivity of the brain, which requires tracing axons across multiple serially-cut sections. Registration of axonal sections is challenging due to several factors, such as sparseness of the axons and complications of the sectioning process, including tissue deformation and loss. This paper investigates a method for registering sections using centerline traces which provide the locations of axons at section boundaries and the angles at which the axons approach the boundaries. This information is used to determine correspondences between two serial sections. Both global and local differences are accounted for using rigid and non-rigid transforms. Results show that utilizing information from traced axons allows axon continuity across sections to be restored.
  • Keywords
    biological tissues; biomechanics; biomedical optical imaging; brain; deformation; fluorescence; image registration; medical image processing; neurophysiology; optical microscopy; 3D neurite tracing; brain; centerline tracing; long range connectivity; neuron confocal microscopy stacks; tissue deformation; tissue loss; trace driven registration; tracing axons; Accuracy; Biomedical imaging; Microscopy; Nerve fibers; Optical microscopy; Transforms; Axonal section registration; Non-rigid point registration; Serial section registration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872649
  • Filename
    5872649