DocumentCode
3509994
Title
An improved model of man for ESD applications
Author
Amoruso, V. ; Helali, Mohamed ; Lattarulo, Francesco
Author_Institution
Dipt. di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
fYear
1999
fDate
28-30 Sept. 1999
Firstpage
335
Lastpage
343
Abstract
Human-generated ESD current waveshapes are predicted under contact discharge and arc discharge conditions. The uncertainties connected to the man´s posture and proximity to the victim element are carefully examined. The adopted human body model is devised to be composed of 11 elemental blocks and treated by the diakoptic method in analogy with network theory. The set of given leakage capacitances, in conjunction with the resistances and inductances as serial parameters, forms a complex RLC network. The assembly includes the grounded or ungrounded victim element and image elements due to the presence of the plane and a nearby vertical wall. PSPICE software allows the discharge scenario to be evaluated. New insight into the complex charge transfer is thus gained, which has been combined with arc derived performances. This careful analytical interpretation of the ESD phenomenon could contribute to in-progress standardization.
Keywords
SPICE; arcs (electric); capacitance; electric resistance; electrostatic discharge; inductance; network topology; software tools; ESD applications; ESD phenomenon; PSPICE software; arc derived performance; arc discharge; charge transfer; complex RLC network; contact discharge; diakoptic method; discharge scenario; grounded victim element; human body model; human posture; human proximity; human-generated ESD current waveshapes; image elements; in-progress standardization; inductances; leakage capacitances; network theory; resistances; serial parameters; ungrounded victim element; victim element; Arc discharges; Assembly; Biological system modeling; Capacitance; Charge transfer; Diakoptics; Electrostatic discharge; Humans; SPICE; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location
Orlando, FL, USA
Print_ISBN
1-58637-007-X
Type
conf
DOI
10.1109/EOSESD.1999.819081
Filename
819081
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