DocumentCode
3510353
Title
Proceedings 1996 IEEE Hong Kong Electron Devices Meeting
fYear
1996
fDate
29-29 June 1996
Abstract
The following topics were dealt with: sensor technology; thin film processing; silicon devices-SOI devices, SOI, device simulation and reliability; compound semiconductors
Keywords
semiconductor devices; SOI; SOI devices; compound semiconductors; device simulation; electron devices; reliability; sensor technology; silicon devices; thin film processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1996., IEEE Hong Kong
Conference_Location
Hong Kong
Print_ISBN
0-7803-3091-9
Type
conf
DOI
10.1109/HKEDM.1996.566291
Filename
566291
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