DocumentCode
3510662
Title
Investigation of durability analysis method based on performance degradation analysis
Author
Yang, Moucun ; Zhang, Ling ; Hong, Nie ; Xu, Haihan
Author_Institution
Sch. of Mech. & Power Eng. Nanjing, Nanjing Univ. of Technol., Nanjing, China
fYear
2009
fDate
20-24 July 2009
Firstpage
1066
Lastpage
1070
Abstract
One of the main concerns of mechanical structures is structural damage due to fatigue. This phenomenon is accentuated in initial flaw of structure, areas of stress concentration, and the connection of components, etc. Initial fatigue quality and configuration of structure have the most important effect on durability. However, obtaining equivalent initial flaw size (EIFS) of structure with durability tests is very costly and time-consuming. A new method of determining initial fatigue quality and crack growth rate is presented with performance degradation curves of specimens in this paper. Specimens with one rivet hole are used in the tests. According to test results and theoretic derivation, the relationship of crack length with loading cycle is established. Then, EIFS values are calculated and fatigue crack growth rates are estimated using exponential fitness technique. The applicability and validity of the method are verified with theoretic computation of fracture limit finally.
Keywords
crack detection; durability; fatigue cracks; life testing; structural engineering; durability analysis method; durability tests; exponential fitness technique; fatigue crack growth rate; mechanical structures; performance degradation analysis; stress concentration; structural damage; Degradation; Educational institutions; Fatigue; Geometry; Length measurement; Performance analysis; Power engineering; Resonant frequency; Stress; Testing; crack growth rate; durability analysis; equivalent initial flaw size (EIFS); fracture limit; performance degradation analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4903-3
Electronic_ISBN
978-1-4244-4905-7
Type
conf
DOI
10.1109/ICRMS.2009.5269998
Filename
5269998
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