• DocumentCode
    3511851
  • Title

    An automatic additive and multiplicative noise removal scheme with sharpness preservation

  • Author

    Qin, Jing ; Guo, Weihong

  • Author_Institution
    Dept. of Math., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1819
  • Lastpage
    1822
  • Abstract
    To remove noise from biomedical images polluted by excessive and inhomogeneous additive or multiplicative noise, most of the denoising algorithms cannot keep a desirable balance between denoising and preservation of fine features; only work for one specific noise; and involve heuristic parameter tuning. We present a fully automatic approach to preserve sharp edges and fine details while removing noise. Explained in nonlocal means scheme, we propose a segmentation boosted NL-means filter (SNL) based on the concept of mutual position function to ensure averaging is only taken over pixels in the same phase. To address unreliable segmentation due to excessive noise, we apply SNL filtering in an iterative way. Comparison with ROF, BM3D, K-SVD and the original NL-means on simulated data, MRI and SEM images indicates potentials of our method.
  • Keywords
    biomedical MRI; image denoising; image segmentation; iterative methods; medical image processing; nonlinear filters; scanning electron microscopy; singular value decomposition; BM3D; K-SVD; MRI; ROF; SEM; automatic additive noise removal; automatic multiplicative noise removal; biomedical images; denoising algorithms; feature preservation; heuristic parameter tuning; iterative methods; mutual position function; nonlocal means scheme; segmentation boosted NL-means filter; sharpness preservation; Image segmentation; Level set; Noise measurement; Noise reduction; PSNR; Pixel; Image denoising; Nonlocal means; segmentation; sharp;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872760
  • Filename
    5872760