• DocumentCode
    3512138
  • Title

    Trajectory planning with Augmented Reality for improved risk assessment in image-guided keyhole neurosurgery

  • Author

    Shamir, Reuben R. ; Horn, Martin ; Blum, Tobias ; Mehrkens, Jan H. ; Shoshan, Yigal ; Joskowicz, Leo ; Navab, Nassir

  • Author_Institution
    Comput. Aided Med. Procedures, Tech. Univ. Munchen, Munich, Germany
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1873
  • Lastpage
    1876
  • Abstract
    We present a new preoperative planning method for reducing the risk associated with the insertion of straight tools in image-guided keyhole neurosurgery. The method quantifies the risks of multiple candidate trajectories and presents them on a physical model of a head using Augmented Reality (AR) to assist the neurosurgeon in selecting the safest path. The surgeon can then define and/or revise the trajectory in the physical space with AR visualization of risk structures such as blood vessels and ventricles, tool placement uncertainty, and quantitative risk measurements. Then, the neurosurgeon can revise the selected path on the 2D MRI image slices to incorporate all relevant information. Finally, a simulation of the surgery can be performed on the physical head model for a more detailed examination of the possible risks. Our preliminary results on clinical data show that in complex situations the method can improve risk assessment.
  • Keywords
    augmented reality; biomedical MRI; blood vessels; medical image processing; neurophysiology; surgery; 2D MRI image; augmented reality; blood vessels; image-guided keyhole neurosurgery; preoperative planning method; quantitative risk measurements; risk assessment; tool placement uncertainty; trajectory planning; ventricles; Decision support systems; augmented reality; computer aided surgery; path planning; personalized medicine; simulation; uncertainty visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872773
  • Filename
    5872773