DocumentCode
351483
Title
Parameter extraction using lateral and vertical optimization
Author
Ortiz-Conde, A. ; Ma, Yuansheng ; Thomson, J. ; Santos, E. ; Liou, J.J. ; Sánchez, F. J Garcìa ; Lei, M. ; Finol, J. ; Layman, P.
Author_Institution
Dept. of Electron., Univ. Simon Bolivar, Caracas, Venezuela
Volume
1
fYear
2000
fDate
2000
Firstpage
165
Abstract
We revisited the direct lateral optimization method, which is based on the approach of minimizing the error on the lateral axis. We compare the efficiency and robustness of the widely used vertical optimization and the present lateral optimization methods
Keywords
optimisation; semiconductor device models; error minimization; lateral optimization; parameter extraction; semiconductor device; vertical optimization; Extrapolation; Low pass filters; Measurement errors; Optimization methods; Parameter extraction; Robustness; Semiconductor devices; Semiconductor diodes; USA Councils; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location
Nis
Print_ISBN
0-7803-5235-1
Type
conf
DOI
10.1109/ICMEL.2000.840546
Filename
840546
Link To Document