• DocumentCode
    3517485
  • Title

    Diagnosis photovoltaic failure by simple function method to acquire I–V curve of photovoltaic modules string

  • Author

    Hirata, Youichi ; Noro, Shouta ; Aoki, Takumi ; Miyazawa, Satoru

  • Author_Institution
    Tokyo Univ. of Sci., Nagano, Japan
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    PV module or a cluster of module failure leads to lower the generating time rate and decrease its power amount. Detection and repair are apprehended to be the constructor´s burden. This study aims to constitute the diagnosis function and system. In the future, this mechanism assumes to detect some faults and failures automatically. This method enables to acquire I-V curves of PV modules strings; each I-V curve is divided into two areas. One area is Voltage dependent areas, which voltage varies less, to combine the input capacitance inside of a power conditioner and the variable DC power. This configuration enables to reduce DC power capacity. The other area is Current dependent. I-V characteristic is obtained in each two areas and connected. Consequently, I-V curve of all part is acquired without preventing PV generation from suspension a little. The measurement function and method were investigated and performed. The availability is confirmed to acquire I-V curve for diagnosis detection.
  • Keywords
    failure analysis; fault diagnosis; solar cells; DC power capacity; I-V characteristic; I-V curve; PV generation; PV module; diagnosis photovoltaic failure function; photovoltaic module string; power conditioner; simple function method; variable DC power; voltage dependent areas; Area measurement; Capacitance; Current measurement; Photovoltaic systems; Resistance; Silicon; Voltage measurement; current-voltage characteristics; curve fitting; failure analysis; fault detection; photovoltaic systems; power conditioning; system analysis design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317848
  • Filename
    6317848