Toward ultra thin CIGS solar cells

Author

Marsillac, Sylvain ; Ranjan, Vikash ; Aryal, Krishna ; Little, Scott ; Erkaya, Yunus ; Rajan, Grace ; Boland, Patrick ; Attygalle, Dinesh ; Aryal, Puruswottam ; Pradhan, Puja ; Collins, Robert W.

Author_Institution

Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norlfolk, VA, USA

fYear

2012

fDate

3-8 June 2012

Abstract

In this paper, we present our results on the fabrication of solar cells down to thicknesses of 0.5 μm, and how real time and in situ analysis by spectroscopic ellipsometry (SE) can help in (i) understanding the results of the devices; and (ii) modeling the growth and properties of the CIGS solar cell. These in situ and real time measurements are correlated with ex situ structural measurements of the films such as XRD and AFM; broad spectral range optical measurements of the films and devices such as T&R, variable angle SE; and device specific measurements such as I-V and QE measurements.

Keywords

X-ray diffraction; atomic force microscopy; solar cells; thin film devices; AFM; I-V measurements; QE measurements; XRD; broad spectral range optical measurements; ex situ structural measurements; in situ measurements; real time measurements; size 0.5 mum; solar cell fabrication; spectroscopic ellipsometry; ultrathin CIGS solar cells; Dielectric measurements; Indium; Nickel; Optical device fabrication; Optical materials; Photonic band gap; photovoltaic cells; spectroscopic ellipsometry; thin film devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE

Conference_Location

Austin, TX

ISSN

0160-8371

Print_ISBN

978-1-4673-0064-3

Type

conf

DOI

10.1109/PVSC.2012.6317878

Filename

6317878