• DocumentCode
    3519605
  • Title

    On the error exponents for detecting randomly sampled noisy diffusion processes

  • Author

    Hachem, Walid ; Moulines, Eric ; Najim, Jamal ; Roueff, Francois

  • Author_Institution
    CNRS, Telecom ParisTech (ENST), Paris
  • fYear
    2009
  • fDate
    19-24 April 2009
  • Firstpage
    2169
  • Lastpage
    2172
  • Abstract
    This paper deals with the detection of a continuous random process described by an Ornstein-Uhlenbeck (O-U) stochastic differential equation. Randomly spaced sensors or equivalently a random time sampler which deliver noisy samples of the process are used for this detection. Two types of tests are considered: either H0 refers to the presence of the noisy O-U process or H0 refers to the sole presence of noise. For any fixed false alarm probability, it is shown that the type II error probability decreases to zero exponentially in the number of samples. The exponents, which do not depend on the false alarm probability, are characterized. This work completes former contributions that consider noiseless O-U process with a random sampling or noisy O-U processes with a regular sampling.
  • Keywords
    differential equations; distributed sensors; signal sampling; stochastic processes; Ornstein-Uhlenbeck stochastic differential equation; continuous random process detection; error exponents; fixed false alarm probability; noisy O-U process; random sampling; random time sampler; randomly sampled noisy diffusion processes; randomly spaced sensors; type II error probability; Difference equations; Differential equations; Diffusion processes; Error probability; Random processes; Sampling methods; Sensor phenomena and characterization; Stochastic resonance; Telecommunications; Testing; Error Exponents; Neyman-Pearson Detection; Ornstein-Uhlenbeck Processes; Sensor Networks; Stability of Markov Processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2009. ICASSP 2009. IEEE International Conference on
  • Conference_Location
    Taipei
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-2353-8
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2009.4960047
  • Filename
    4960047