• DocumentCode
    3520403
  • Title

    Preliminary study of a new process to improve the strength of thermo-sonic ball solder joint

  • Author

    Yu, Zhai ; Wang, Zhao ; Cheng, Jun ; Tian, Hw

  • Author_Institution
    ShenZhen Inst. of Adv. Integration Technol., Chinese Univ. of Hong Kong, Shenzhen, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    742
  • Lastpage
    748
  • Abstract
    The separation of golden ball and die pad due to the poor bonding strength of 1st ball solder joint is the main failure mode in thermo-sonic ball wire bonding. In this paper, nonlinear elastic and elasto-plastic quasi-static analysis of FAB (free air ball) in ultrasonic vibration process is carried out by finite element method with ANSYS. We study the evolution way of compressive stress distributions of FAB and sliding area in the contact interface under elastic and elasto-plastic deformation. According to the results of the analysis and the mechanism of micro-slip based on elastic theoretical assumption, we propose a new bonding process control that can improve the bonding strength of 1st ball solder joint effectively.
  • Keywords
    compressive strength; elastic deformation; elastoplasticity; electronics packaging; failure analysis; finite element analysis; lead bonding; mechanical strength; reliability; slip; soldering; ANSYS; bonding process control; bonding strength; chip package reliability; compressive stress distribution; die pad; elasto-plastic deformation; elasto-plastic quasistatic analysis; finite element method; free air ball analysis; golden ball; microslip mechanism; nonlinear elastic analysis; thermo-sonic ball solder joint; ultrasonic vibration process; wire bonding; Analytical models; Bonding forces; Bonding processes; Chemical analysis; Compressive stress; Finite element methods; Plastics; Soldering; Vibrations; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270649
  • Filename
    5270649