• DocumentCode
    3520466
  • Title

    Millimeter wave dielectric characterization & demonstration of High-Q passives using a low loss thin film material

  • Author

    Ying, Lim Ying ; Su, Nandar ; Wee, David Ho Soon ; Thaw, Phyo Phyo ; Wang, Orson ; Kuriyama, Hijiri ; Yokotsuka, Shun ; Shirashi, Kenichi

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    518
  • Lastpage
    523
  • Abstract
    In this paper, we demonstrate the extraction of the effective dielectric properties of a new low-k thin film material, up to the millimeter wave region (110 GHz). This is achieved using a CPWG T-resonator. In literature, such a configuration has not been considered before, as a 50-Ohm structure is usually designed for the T-resonator. In this work, we show that using a non-50 Ohm structure has no influence on the extracted effective dielectric constant, which can be achieved within an accuracy of 4% up to 110 GHz. In addition, we investigate the effects of temperature variation on the thin film dielectric property. High-Q inductors were also designed on high-resistivity silicon and glass substrates.
  • Keywords
    dielectric resonators; inductors; low-k dielectric thin films; millimetre wave devices; CPWG T-resonator; Si; SiO2; effective dielectric constant; effective dielectric properties; frequency 110 GHz; glass substrates; high-Q inductors; high-Q passives; high-resistivity silicon substrates; low loss thin film material; low-k thin film material; millimeter wave dielectric characterization; millimeter wave region; thin film dielectric property; Data mining; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric substrates; Dielectric thin films; Frequency; Glass; Millimeter wave technology; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416492
  • Filename
    5416492