• DocumentCode
    3520884
  • Title

    Towards fabrication of low cost high efficiency c-Si solar cells: Progress and optimization using TCAD simulation study

  • Author

    Murukesan, Karthick ; Mavilla, Narasimha Rao

  • Author_Institution
    Nat. Centre for Photovoltaic Res. & Educ, IIT Bombay, Mumbai, India
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Progress of experimental and simulation work, in optimizing baseline processes for low cost, high efficiency c-Si solar cells is presented. Phosphorous diffusion at 890 °C for 15 minutes was optimized to a obtain sheet resistance of 30 Ω/□ for selective emitter region. Active area of the cell, excluding areas of front metal contact grid, was selectively etched back to obtain emitter sheet resistance of 90 Ω/□ for lightly doped emitter. Optimization of Boron diffusion for N-type solar cells was attempted. Particularly, the material properties of boron rich layer are being explored to arrive at low cost means of removing this dead layer rather than the conventional low temperature furnace processing. An initial cell (without texturing), incorporating some of these process steps resulted in 13.1% efficiency. To understand various losses and improve the efficiency further, Sentaurus TCAD simulation study was initiated.
  • Keywords
    boron; electrical engineering computing; elemental semiconductors; phosphorus; silicon; solar cells; technology CAD (electronics); B; N-type solar cells; P; Sentaurus TCAD simulation study; Si; baseline processes; efficiency 13.1 percent; lightly doped emitter; low temperature furnace processing; material properties; selective emitter region; temperature 890 degC; time 15 min; Biological system modeling; Boron; Charge carrier lifetime; Computational modeling; Photovoltaic cells; Process control; Temperature control; Boron diffusion; Phosphorus diffusion; TCAD simulation; c-Si solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318037
  • Filename
    6318037