• DocumentCode
    3520978
  • Title

    Research on strength descent of wire bonding in the packing

  • Author

    Dezheng, Zhang ; Shengxiang, Bao ; Lili, Ma ; Dechun, Lv

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    381
  • Lastpage
    383
  • Abstract
    For microelectronics packaging, it connects the substrates with pin wire in the way of wire bonding for separate electronic components packing, and also called wire bonding technology. For a long time, rockii effect is thought as the normal invalid forms. But now the more and more study shows Kiekendall voids are the main factors that influence the bonding intensity. Aiming at the model SOT23 transistor, we analysis the form of Kiekendall voids of wire bonding.
  • Keywords
    integrated circuit packaging; lead bonding; substrates; transistors; Kickendall voids; SOT23 transistor; electronic components packing; microelectronics packaging; pin wire; rockii effect; substrates; wire bonding; Bonding; Electronic components; Electronics packaging; Gold; Intermetallic; Microelectronics; Probes; Substrates; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416519
  • Filename
    5416519