DocumentCode
3520978
Title
Research on strength descent of wire bonding in the packing
Author
Dezheng, Zhang ; Shengxiang, Bao ; Lili, Ma ; Dechun, Lv
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
381
Lastpage
383
Abstract
For microelectronics packaging, it connects the substrates with pin wire in the way of wire bonding for separate electronic components packing, and also called wire bonding technology. For a long time, rockii effect is thought as the normal invalid forms. But now the more and more study shows Kiekendall voids are the main factors that influence the bonding intensity. Aiming at the model SOT23 transistor, we analysis the form of Kiekendall voids of wire bonding.
Keywords
integrated circuit packaging; lead bonding; substrates; transistors; Kickendall voids; SOT23 transistor; electronic components packing; microelectronics packaging; pin wire; rockii effect; substrates; wire bonding; Bonding; Electronic components; Electronics packaging; Gold; Intermetallic; Microelectronics; Probes; Substrates; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location
Singapore
Print_ISBN
978-1-4244-5099-2
Electronic_ISBN
978-1-4244-5100-5
Type
conf
DOI
10.1109/EPTC.2009.5416519
Filename
5416519
Link To Document