DocumentCode
3521420
Title
Effect of strain rate and temperature on tensile flow behavior of SnAgCu nanocomposite solders
Author
Chandra Rao, B.S.S. ; Mohan Kumar, K. ; Zeng, K.Y. ; Tay, A.A.O. ; Kripesh, V.
Author_Institution
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
272
Lastpage
277
Abstract
The tensile flow behavior of Sn-3.8Ag-0.7Cu (SAC387) nanocomposite solders have been studied with strain rates ranging from 10-5 to 10-1 s-1 and at temperature of 25, 75 and 125°C. The flow stress and the Hollomon parameters were observed to increase substantially with increasing strain rate. The strain hardening exponent increased substantially with increasing strain rate and decreasing with temperature for all the composite solders investigated. The strain rate dependence of strain hardening exponent was stronger at higher temperatures for SAC387 solder alloy, while it is weaker for composite solders reinforced with nano sized Mo particles. The strain hardening exponent was found to be less sensitive to temperature at higher strain rates. The fractographic features of ambient and elevated temperature tensile fracture surfaces of the nanocomposite solders deformed at various strain rates are discussed.
Keywords
copper alloys; nanocomposites; silver alloys; solders; tin alloys; work hardening; Hollomon parameters; SnAgCu; fractographic features; nanocomposite solders; strain hardening exponent; temperature 125 C; temperature 25 C; temperature 75 C; temperature tensile fracture surfaces; Capacitive sensors; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Lead; Microelectronics; Soldering; Temperature distribution; Temperature sensors; Tensile strain; Tensile stress; Lead-free composite solders; Strain Rate; Strain hardening exponent;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location
Singapore
Print_ISBN
978-1-4244-5099-2
Electronic_ISBN
978-1-4244-5100-5
Type
conf
DOI
10.1109/EPTC.2009.5416539
Filename
5416539
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