DocumentCode
3521533
Title
Test of the European Joint Research Centre performance model for c-Si PV modules
Author
Yordanov, Hristov ; Tayyib, Muhammad ; Midtgard, Ole-Morten ; Odden, Jan-Ove ; Saetre, Tor Oskar
Author_Institution
Univ. of Agder (UiA), Grimstad, Norway
fYear
2012
fDate
3-8 June 2012
Abstract
The performance of ten c-Si PV modules is studied at different levels of illumination and module temperatures and is modeled in terms of relative efficiency with respect to Standard Testing Conditions (STC). A recently proposed model is tested in Nordic conditions for generic mono- and mc-Si devices with screen-printed cells as well as for some high-efficiency cell designs. Two of the modules are field aged. Averaged model coefficients are derived and compared to values found in the literature. Irradiance and module temperatures measured in 2011 are then used to estimate the expected annual energy yields. The measured yields equal the predicted ones within 1.6% (mean bias error -1.0%) which suggests good modeling accuracy. The annual average relative efficiency of new c-Si modules for the test site in Southern Norway is 0.95, among the highest values in Europe. It is attributed to cool ambient air and frequent windy conditions. A theoretical relationship is derived between the first coefficient of the performance model and I-V curve model parameters. Fitted and predicted values agree well for most of the tested devices. The equation may be used by module manufacturers as a quantitative guideline for designing products with superior energy yields.
Keywords
elemental semiconductors; silicon; solar cells; European Joint Research Centre performance model; I-V curve model parameters; Nordic conditions; PV modules; STC; Si; Southern Norway; averaged model coefficients; high-efficiency cell designs; illumination; module temperatures; screen-printed cells; standard testing conditions; Equations; Europe; Guidelines; Indexes; Loss measurement; Mathematical model; Standards; coefficients; energy efficiency; modeling; performance analysis; relative efficiency; testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6318077
Filename
6318077
Link To Document