DocumentCode
3521554
Title
Bonding head design for thin wafer
Author
Lee, Changwoo ; Lee, Jaehak ; Ha, Tae Ho ; Song, Junyeob
Author_Institution
Dep. of Ultra Precision Machines & Syst., Korea Inst. of Machinery & Mater., Daejeon, South Korea
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
220
Lastpage
224
Abstract
In this paper, porous vacuum picker and bonding head to impose uniform pressure on all the surface of wafer in the bonding process are proposed newly. Porous vacuum picker could reduce deformation and warpage problem during handling thin wafer because it has many number of small vacuum hole which induce small vacuum pressure at those holes region. Also, to impose uniform pressure on the wafer under bonding process, bonding head is designed using air piston type with metal ball joint, which automatically compensate for coplanarity problem of bonding pad. FEM analysis and experiments are conducted to evaluate the performance of porous vacuum picker and bonding head of air piston type.
Keywords
finite element analysis; wafer bonding; FEM analysis; bonding head design; bonding pad; bonding process; coplanarity problem; deformation; finite element method; metal ball joint; porous vacuum picker; thin wafer handling; thin wafer surface; vacuum hole; vacuum pressure; warpage problem; Bonding processes; Fabrication; Machinery; Machining; Magnetic heads; Packaging; Pistons; Vacuum systems; Vacuum technology; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location
Singapore
Print_ISBN
978-1-4244-5099-2
Electronic_ISBN
978-1-4244-5100-5
Type
conf
DOI
10.1109/EPTC.2009.5416546
Filename
5416546
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