DocumentCode
3521569
Title
Field induced quantum confinement in Indirect Semiconductors: Quantum mechanical and modified semiclassical model
Author
Vandenberghe, William G. ; Sorée, Bart ; Magnus, Wim ; Groeseneken, Guido ; Verhulst, Anne S. ; Fischetti, Massimo V.
fYear
2011
fDate
8-10 Sept. 2011
Firstpage
271
Lastpage
274
Abstract
Going beyond the existing semiclassical approach to calculate band-to-band tunneling (BTBT) current we have developed a quantum mechanical model incorporating confinement effects and multiple electron and hole valleys to calculate the tunnel current in a tunnel field-effect transistor. Comparison with existing semiclassical models reveals a big shift in the onset of tunneling due to energy quantization. We show that the big shift due to quantum confinement is slightly reduced by taking penetration into the gate dielectric into account. We further propose a modified semiclassical model capable of accounting for quantum confinement.
Keywords
MOSFET; semiconductor device models; tunnel transistors; tunnelling; band-to-band tunneling current; electron valleys; energy quantization; field induced quantum confinement; gate dielectric; hole valleys; indirect semiconductors; quantum mechanical model; semiclassical model; tunnel field-effect transistor; Dielectrics; Doping; Logic gates; Semiconductor process modeling; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
Conference_Location
Osaka
ISSN
1946-1569
Print_ISBN
978-1-61284-419-0
Type
conf
DOI
10.1109/SISPAD.2011.6035077
Filename
6035077
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