• DocumentCode
    3521569
  • Title

    Field induced quantum confinement in Indirect Semiconductors: Quantum mechanical and modified semiclassical model

  • Author

    Vandenberghe, William G. ; Sorée, Bart ; Magnus, Wim ; Groeseneken, Guido ; Verhulst, Anne S. ; Fischetti, Massimo V.

  • fYear
    2011
  • fDate
    8-10 Sept. 2011
  • Firstpage
    271
  • Lastpage
    274
  • Abstract
    Going beyond the existing semiclassical approach to calculate band-to-band tunneling (BTBT) current we have developed a quantum mechanical model incorporating confinement effects and multiple electron and hole valleys to calculate the tunnel current in a tunnel field-effect transistor. Comparison with existing semiclassical models reveals a big shift in the onset of tunneling due to energy quantization. We show that the big shift due to quantum confinement is slightly reduced by taking penetration into the gate dielectric into account. We further propose a modified semiclassical model capable of accounting for quantum confinement.
  • Keywords
    MOSFET; semiconductor device models; tunnel transistors; tunnelling; band-to-band tunneling current; electron valleys; energy quantization; field induced quantum confinement; gate dielectric; hole valleys; indirect semiconductors; quantum mechanical model; semiclassical model; tunnel field-effect transistor; Dielectrics; Doping; Logic gates; Semiconductor process modeling; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
  • Conference_Location
    Osaka
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-61284-419-0
  • Type

    conf

  • DOI
    10.1109/SISPAD.2011.6035077
  • Filename
    6035077