• DocumentCode
    352195
  • Title

    A physical approach to mismatch modelling and parameter correlations

  • Author

    Oelun, J. ; Grünebaum, Ulrich ; Schumacher, Klaus

  • Author_Institution
    Dortmund Univ., Germany
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    377
  • Abstract
    The currently available first order mismatch models cannot explain many of the observed effects. The physical modelling approach described in this paper leads to a deeper understanding and gives a very precise description of actual mismatch behaviour including parameter correlations in a closed form. The model needs only few parameters which are discussed below
  • Keywords
    integrated circuit modelling; integrated circuit; mismatch effects; parameter correlations; physical model; Convolution; Fabrication; Frequency; Geometry; MOSFETs; Predictive models; Semiconductor device modeling; Time domain analysis; Topology; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.858767
  • Filename
    858767
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=352195