• DocumentCode
    3524089
  • Title

    Advanced PV module performance characterization and validation using the novel Loss Factors Model

  • Author

    Sellner, Stefan ; Sutterlüti, Jürgen ; Schreier, Ludwig ; Ransome, Steve

  • Author_Institution
    Oerlikon Solar Ltd., Trübbach, Switzerland
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    The Loss Factors Model (LFM) [1] allows PV modules of any technology to be characterized by outdoor IV measurements into six normalized, independent and physically significant coefficients plus correction factors for module temperature and spectral mismatch. These fitted coefficients allow the prediction and validation of PV module performance under any weather conditions. Their magnitudes at higher irradiance levels extrapolate to the STC values to be compared with flash test or datasheet values, values at lower irradiance give the low light performance (LLEC), their gradients vs. module temperature determine temperature coefficients alpha, beta, gamma etc. Differences of the individual LFM coefficients can be seen between single or double junction thin film vs. crystalline silicon technologies with the latter having lower resistance losses. The shapes of any changes with time allow the seasonal annealing or degradation of performance to be distinguished and evaluated.
  • Keywords
    photovoltaic power systems; LFM coefficients; LLEC; STC values; advanced PV module performance characterization; irradiance levels; loss factors model; low light performance; module temperature; outdoor IV measurements; performance degradation; physically significant coefficients plus correction factors; seasonal annealing; spectral mismatch; temperature coefficients alpha; temperature coefficients beta; temperature gamma; Bars; Degradation; Loss measurement; Shape; Temperature distribution; Temperature measurement; Energy; Modeling; Photovoltaic systems; Power; characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318201
  • Filename
    6318201