• DocumentCode
    3524655
  • Title

    An Asymptotic Regression Predictive Model for Sphere Gap Voltage with Gap Diameter and Gap Spacing

  • Author

    Chatpattananan, V.

  • Author_Institution
    Fac. of Eng., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    This document develops two asymptotic regression models to estimate the value of sphere gap breakdown voltage from any value of gap diameter and gap spacing under IEC 60052 table 2 and table 3 to facilitate those two IEC tables that provide limited values consisting of 12 sizes in sphere diameter ranging from 20 mm to 2000 mm and sphere gap spacing range from 0.5 mm to 1500 mm. In those two IEC tables, the relationship of sphere gap voltages from sphere gap diameter and gap spacing is nonlinear in which asymptotic regression models are proposed is in the form Voltage = b1+ b2eb 3Spacing + b4Diameter that follows the law of diminishing returns that imitates the relationship between sphere gap voltages versus sphere gap diameter and gap spacing. By using this asymptotic regression, this document provides expressions of standard sphere gap voltages as functions of the sphere gap diameter and gap spacing. The expressions are in high accuracy measured by r2 values. These proposed asymptotic regression equations can be used to estimate sphere gap voltage breakdown from any values of sphere gap diameter and gap spacing that are not specified by IEC 60052 tables.
  • Keywords
    IEC standards; electric breakdown; regression analysis; IEC 60052 tables; asymptotic regression predictive model; sphere gap breakdown voltage; sphere gap diameter; sphere gap spacing; Atmospheric measurements; Breakdown voltage; Dielectrics and electrical insulation; Equations; IEC standards; Predictive models; Pressure measurement; Pulse measurements; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0546-7
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.312109
  • Filename
    4105417