• DocumentCode
    3525352
  • Title

    Evaluations of scintillation properties of LiSrAlF6 scintillator for thermal neutron detection

  • Author

    Yanagida, Takayuki ; Kawaguchi, Noriaki ; Fujimoto, Yutaka ; Yokota, Yuui ; Yamazaki, Atsushi ; Watanabe, Kenichi ; Kamada, Kei ; Yoshikawa, Akira

  • Author_Institution
    FMRAM, Tohoku Univ., Sendai, Japan
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    182
  • Lastpage
    184
  • Abstract
    Ce 1%, Eu 1%, and Eu 2%-doped LiSrAlF6 (LiSAF) single crystals were grown by the micro-pulling-down (μ-PD) method for thermal neutron applications. The crystals were transparent, 2.0 mm in diameter and 20-40 mm in length. Neither visible inclusions nor cracks were observed. Their transmittance spectra were measured. The strong absorption lines were observed at 200, 240, and 300 nm for Ce:LiSAF due to Ce3+ 4f-5d transition. In Eu:LiSAF, 200 (4f-5d) and 300 (4f-4f) nm absorption lines appeared. When they were irradiated by 241Am α-ray simulating neutron excitation, strong emission peak appeared at 300 nm in Ce:LiSAF and 370 nm in Eu:LiSAFs, respectively. Thermal neutron responses were investigated under 252Cf irradiation. The absolute light yield of Ce, Eu 1%, and Eu 2% samples were 3400, 18000, and 30000 ph/n, respectively. Main components of the scintillation decay time of Ce, Eu 1%, and Eu 2%-doped LiSAFs were 63, 1293, and 1205 ns.
  • Keywords
    neutron detection; solid scintillation detectors; 241Am alpha-ray simulating neutron excitation; LiSrAlF6 scintillator detector; absorption line; micropulling-down method; scintillation decay time; scintillation properties; size 2.0 mm; size 20 mm to 40 mm; thermal neutron detection; thermal neutron response; transmittance spectra measurement; wavelength 200 nm; wavelength 240 nm; wavelength 300 nm; Crystals; Luminescence; Neutrons; Optical device fabrication; Optical pulses; Optical variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873741
  • Filename
    5873741