DocumentCode
3525760
Title
Doppler continuous wave scanning acoustic microscope
Author
Titov, S.A. ; Maev, R.G.
Author_Institution
Center for Imaging Res. & Adv. Mater. Characterization, Windsor Univ., Ont., Canada
Volume
1
fYear
1997
fDate
5-8 Oct 1997
Firstpage
713
Abstract
A modification of V(z) method is presented in this paper. It is proposed to use the Doppler effect in the continuous wave reflection scanning acoustic microscope. The Doppler frequency shift is created due to constant velocity movement of the lens perpendicular to the sample surface. A Doppler continuous wave microscope with an operating frequency of 300 MHz was developed. The device was tested on the investigations of the materials with known acoustical parameters
Keywords
Doppler measurement; acoustic microscopes; 300 MHz; Doppler continuous wave reflection scanning acoustic microscope; V(z) method; Acoustic devices; Acoustic reflection; Acoustic testing; Acoustic waves; Doppler effect; Frequency; Lenses; Materials testing; Microscopy; Surface acoustic wave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location
Toronto, Ont.
ISSN
1051-0117
Print_ISBN
0-7803-4153-8
Type
conf
DOI
10.1109/ULTSYM.1997.663117
Filename
663117
Link To Document