• DocumentCode
    3527392
  • Title

    A beam test telescope based on the Alibava readout system

  • Author

    Marco-Hernández, R.

  • Author_Institution
    IFIC (CSIC-UV), Paterna, Spain
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    749
  • Lastpage
    754
  • Abstract
    A telescope for a beam test have been developed. The system is intended to measure the spatial resolution performance of different types of silicon detectors. The telescope has four XY measurement as well as trigger planes (XYT board). It can accommodate up to twelve devices under test (DUT board). The DUT board uses two Beetle ASICs for the readout of chilled DUT, microstrip or pixel silicon detectors. The XYT board triggers on the particle tracks in the beam test. It also measures the track space points using two silicon strip detectors connected to two Beetle ASICs. An Alibava mother board is used to read out and to control each XYT/DUT board from a common trigger signal and clock signal. A master board distributes the trigger, clock and reset signals. It also merges the data streams from up to sixteen Alibava boards. The master board is connected with the DAQ software via 100M Ethernet. Track based alignment software has also been developed for the data obtained with the DAQ software.
  • Keywords
    application specific integrated circuits; data acquisition; high energy physics instrumentation computing; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; telescopes; trigger circuits; ASIC; Alibava mother board; Alibava readout system; DAQ software; DUT board; Ethernet; XYT trigger board; beam test telescope; master board distribution; microstrip silicon detector; pixel silicon detector; spatial resolution performance; Clocks; Detectors; Field programmable gate arrays; Silicon; Software; Synchronization; Telescopes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873858
  • Filename
    5873858