• DocumentCode
    352892
  • Title

    Development of processing diagrams for underfill resins

  • Author

    Taweeplengsangsuke, J. ; Pearson, R.A.

  • Author_Institution
    Microelectron. Packaging Mater. Lab., Lehigh Univ., Bethlehem, PA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    174
  • Lastpage
    181
  • Abstract
    Underfill resins are used to reduce the solder fatigue in flip-chip assemblies. Both the underfilling and the curing process are crucial to the reliability of the finished products. A variety of techniques have been used to characterize the essential phenomena governing the processing of underfill resins. Such phenomena include wetting, flow behavior, cure kinetics, cure stresses, outgassing phenomena and void formation. We will show that processing diagrams for underfill resins can be developed based on these fundamentals and provide guidelines for the underfilling and curing steps. With such processing diagrams one should be able to design the underfilling and curing process using a scientific approach that allows one to save time and money from the usual trial and error method
  • Keywords
    adhesion; encapsulation; fatigue; flip-chip devices; integrated circuit reliability; soldering; voids (solid); wetting; cure kinetics; cure stresses; flip-chip assemblies; flow behavior; outgassing phenomena; processing diagrams; reliability; solder fatigue; underfill resins; void formation; wetting; Assembly; Bonding; Channel spacing; Curing; Flip chip; Microelectronics; Packaging; Resins; Surface tension; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
  • Conference_Location
    Espoo
  • Print_ISBN
    0-7803-6460-0
  • Type

    conf

  • DOI
    10.1109/ADHES.2000.860594
  • Filename
    860594