DocumentCode
3531416
Title
[Title page]
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
1
Abstract
The following topics are dealt with: next generation instruments and systems;board and system test and diagnosis monitoring, diagnosis and prognostic methods; system-on-chip test mixed-signal and analog test diagnosis for analog circuits; RF/MW/MM test and instrument data acquisition; design-for-test (DFT) BIT/BIST;reliability and design for reliability; test generation fault model and fault simulation high-speed digital test fault tolerance; and test and diagnosis for submicron circuits test and diagnosis of biomedical CAS optoelectronics/test.
Keywords
built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; BIT/BIST; analog circuits; biomedical CAS optoelectronics/test; board and system test; data acquisition; design-for-test; diagnosis monitoring; fault simulation; high-speed digital test fault tolerance; mixed-signal and analog test diagnosis; next generation instruments; system-on-chip test; test generation fault model;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960733
Filename
4960733
Link To Document