Degradation of power semiconductor modules for trains

Author

Fukuda, Toshio

Author_Institution

Railway Tech. Res. Inst., Kokubunji, Japan

fYear

2013

fDate

2-6 Sept. 2013

Firstpage

1

Lastpage

8

Abstract

Various electronic equipment including traction converters is installed in railway vehicles. It is important to improve the reliability of each element constituting the equipment. To obtain the data required for the maintenance and renewal work of traction converters mounted on recent EMUs, we developed a new method to estimate the degradation of power semiconductor modules, which are one of the parts of the converters. In this paper, the results of thermal resistance measurements are reported and degradation estimation for high-voltage / high-current IGBT modules is discussed.

Keywords

electric resistance measurement; insulated gate bipolar transistors; maintenance engineering; power apparatus; power convertors; power field effect transistors; railway electrification; semiconductor device reliability; thermal resistance measurement; traction; EMU; electronic equipment; high-voltage-high-current IGBT module; maintenance; power semiconductor module; railway vehicle; reliability; thermal resistance measurement; traction converter; train; Degradation; Electrical resistance measurement; Insulated gate bipolar transistors; Semiconductor device measurement; Temperature measurement; Thermal resistance; Device characterisation; IGBT; Maintenance; Rail vehicle; Semiconductor device;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Electronics and Applications (EPE), 2013 15th European Conference on

Conference_Location

Lille

Type

conf

DOI

10.1109/EPE.2013.6631757

Filename

6631757