DocumentCode
3534223
Title
Projection correlation based noise reduction in volume CT
Author
Yan, Hao ; Mou, Xuanqin
Author_Institution
Inst. of Image Process. & Pattern Recognition, Xi´´an Jiaotong Univ., Xi´´an, China
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
2948
Lastpage
2953
Abstract
De-noising algorithms for volume CT are proposed based on the correlation of the cone beam (CB) CT projections. The main idea is: when the correlated pixels among the neighboring views are added together according to this projection correlation (PC), the signal will be retained, whereas the noise variance upon them will be reduced by this averaging process, because the signal obeys this correlation but noise not. PC based filtering (PCF) method is developed. PCF is further integrated as PC based penalty weighted least square (PC-PWLS) method. Validations are performed for two volume scans: one is ideal low-dose case, and the other considers the high-frequency scatter residues after scatter correction. By using the proposed methods, significant noise suppressing is illustrated; meanwhile, the spatial resolution can be well preserved. For the low dose scan, SNR (Signal to Noise Ratio) increases are around 14 dB. For the cone beam scan with high frequency scatter residues, an effect approaching to the fan-beam scan is achieved.
Keywords
computerised tomography; correlation methods; filtering theory; image denoising; medical image processing; PC based filtering; SNR; averaging process; computed tomography; cone beam projections; correlated pixels; denoising algorithms; fan-beam scan; high-frequency scatter residues; low dose scan; noise reduction algorithms; noise variance; penalty weighted least square method; projection correlation based noise reduction; scatter correction; signal to noise ratio; spatial resolution; volume CT; volume scans; Computed tomography; Correlation; Noise measurement; Noise reduction; Pixel; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874336
Filename
5874336
Link To Document