• DocumentCode
    3534372
  • Title

    An embedded imaging and signal processing system for flame stability monitoring and characterisation

  • Author

    Sun, Duo ; Lu, Gang ; Yan, Yong

  • Author_Institution
    Sch. of Eng. & Digital Arts, Univ. of Kent, Canterbury, UK
  • fYear
    2010
  • fDate
    1-2 July 2010
  • Firstpage
    210
  • Lastpage
    213
  • Abstract
    This paper presents the design, implementation and evaluation of an instrumentation system for flame stability monitoring and characterisation on industrial furnaces. The system, incorporating digital imaging and spectral analysis techniques, is designed to monitor a range of flame characteristic parameters. The stability of the flame is then assessed through statistical analysis of the flame parameters obtained. Embedded computer techniques are employed to ensure the system is compact and robust. Experiments were conducted on a laboratory-scale combustion test rig to evaluate the system. The impact of the air-to-fuel ratios on the stability of a gaseous flame is investigated. The results demonstrate that the system is capable of monitoring flame stability in a statistical way.
  • Keywords
    combustion; computerised monitoring; embedded systems; flames; furnaces; image processing; production engineering computing; spectral analysis; statistical analysis; air-to-fuel ratio; digital imaging; embedded computer technique; embedded imaging system; flame characteristic parameter; flame stability monitoring; gaseous flame; industrial furnace; instrumentation system; laboratory-scale combustion test rig; signal processing system; spectral analysis; statistical analysis; Computerized monitoring; Condition monitoring; Digital images; Fires; Furnaces; Instruments; Signal processing; Spectral analysis; Stability analysis; Statistical analysis; CMOS camera; embedded technology; flame monitoring; flame stability; photodetector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2010 IEEE International Conference on
  • Conference_Location
    Thessaloniki
  • Print_ISBN
    978-1-4244-6492-0
  • Type

    conf

  • DOI
    10.1109/IST.2010.5548471
  • Filename
    5548471