• DocumentCode
    3536556
  • Title

    Criteria selection for 20×20×15 mm3 pixelated CdZnTe semiconductor detectors

  • Author

    Boucher, Yvan A. ; Zhang, F. ; Kaye, W. ; Zhu, Y. ; Herman, C. ; He, Z.

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    3885
  • Lastpage
    3887
  • Abstract
    Large volume, pixelated Cadmium Zinc Telluride detectors have been developed over the past decade. In November of 2009, Redlen Technologies began manufacturing 130 20×20×15 mm3 CdZnTe detectors, each with a common grid between the 121 pixels, for the Polaris Project. Results for the first 65 detectors were studied to determine a set of criteria that could be used to help streamline the detector testing procedure for large volume CdZnTe detectors. By rejecting detectors with >;5% uncorrected FWHM, >;2 nA/V of total grid-to-anode leakage current, and excessive anode noise detectors with over 1.2% corrected single pixel FWHM at 662 keV were correctly identified 88% of the time. Those with under 1.2% corrected single pixel FWHM at 662 keV were correctly identified 80% of the time.
  • Keywords
    II-VI semiconductors; cadmium compounds; leakage currents; semiconductor counters; CdZnTe; Polaris Project; Redlen Technologies; cadmium zinc telluride; detector testing procedure; electron volt energy 662 keV; excessive anode noise detectors; grid-anode leakage current; large volume pixelated CdZnTe semiconductor detectors; size 15 mm; size 20 mm; Anodes; Calibration; Detectors; Energy resolution; Leakage current; Pixel; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874542
  • Filename
    5874542