DocumentCode
3536556
Title
Criteria selection for 20×20×15 mm3 pixelated CdZnTe semiconductor detectors
Author
Boucher, Yvan A. ; Zhang, F. ; Kaye, W. ; Zhu, Y. ; Herman, C. ; He, Z.
Author_Institution
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
3885
Lastpage
3887
Abstract
Large volume, pixelated Cadmium Zinc Telluride detectors have been developed over the past decade. In November of 2009, Redlen Technologies began manufacturing 130 20×20×15 mm3 CdZnTe detectors, each with a common grid between the 121 pixels, for the Polaris Project. Results for the first 65 detectors were studied to determine a set of criteria that could be used to help streamline the detector testing procedure for large volume CdZnTe detectors. By rejecting detectors with >;5% uncorrected FWHM, >;2 nA/V of total grid-to-anode leakage current, and excessive anode noise detectors with over 1.2% corrected single pixel FWHM at 662 keV were correctly identified 88% of the time. Those with under 1.2% corrected single pixel FWHM at 662 keV were correctly identified 80% of the time.
Keywords
II-VI semiconductors; cadmium compounds; leakage currents; semiconductor counters; CdZnTe; Polaris Project; Redlen Technologies; cadmium zinc telluride; detector testing procedure; electron volt energy 662 keV; excessive anode noise detectors; grid-anode leakage current; large volume pixelated CdZnTe semiconductor detectors; size 15 mm; size 20 mm; Anodes; Calibration; Detectors; Energy resolution; Leakage current; Pixel; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874542
Filename
5874542
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