Perpendicular anisotropy of MBE-grown FePt granular films

Author

Itoh, T. ; Kato, T. ; Iwata, Satoru ; Tsunashima, S.

Author_Institution

Dept. of Electron., Nagoya Univ., Japan

fYear

2005

fDate

4-8 April 2005

Firstpage

1381

Lastpage

1382

Abstract

FePt granular films with total thickness of 3 nm is fabricated by repeating deposition of FePt thin films by molecular beam epitaxy and annealing 6 times at temperatures ranging from 250°C to 450°C. The crystal structure of the granular films is then characterized by reflection high energy electron diffraction and X-ray diffraction. Its surface structure is observed by atomic force microscopy, and its magnetic properties are measured by Kerr loop tracer and torque magnetometer. The results are compared to those of a single layer FePt thin film with 3 nm thickness.

Keywords

X-ray diffraction; annealing; atomic force microscopy; crystal structure; ferromagnetic materials; granular structure; iron alloys; magnetic epitaxial layers; molecular beam epitaxial growth; perpendicular magnetic anisotropy; platinum alloys; reflection high energy electron diffraction; surface structure; 250 to 450 degC; 3 nm; FePt; Kerr loop tracer; X-ray diffraction; annealing; atomic force microscopy; crystal structure; granular films; molecular beam epitaxy; perpendicular anisotropy; reflection high energy electron diffraction; surface structure; torque magnetometer; Anisotropic magnetoresistance; Annealing; Atomic force microscopy; Atomic measurements; Force measurement; Molecular beam epitaxial growth; Optical films; Sputtering; Temperature distribution; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464120

Filename

1464120