Growth and characterization of epitaxial FePt films

Author

Casoli, F. ; Albertini, F. ; Pareti, L. ; Fabbrici, S. ; Nasi, L. ; Bocchi, C. ; Ciprian, R.

Author_Institution

Parco Area delle Sci., CNR, Parma, Italy

fYear

2005

fDate

4-8 April 2005

Firstpage

1385

Lastpage

1386

Abstract

FePt films are prepared by RF sputtering at intermediate temperatures (up to 550°C) followed by thermal annealing at the same temperature. Structural characterization is then performed by means of X-ray diffraction and transmission electron microscopy. The results indicate that the effect of in-situ annealing after the high-temperature growth turns out to be essential in obtaining well-oriented and highly coercive films. The magnetic properties are studied at room temperature by an alternating gradient force magnetometer.

Keywords

X-ray diffraction; annealing; coercive force; crystal microstructure; epitaxial growth; ferromagnetic materials; iron alloys; magnetic epitaxial layers; metallic thin films; platinum alloys; remanence; sputtered coatings; transmission electron microscopy; 550 degC; FePt; RF sputtering; X-ray diffraction; alternating gradient force magnetometer; coercive films; epitaxial films; magnetic properties; room temperature; thermal annealing; transmission electron microscopy; Annealing; Coercive force; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Sputtering; Temperature distribution; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464122

Filename

1464122