• DocumentCode
    3537251
  • Title

    Kinetics of atomic mechanisms of adsorption at the microwave vacuum - plasma deposition of submonolayer carbon coverings on silicon crystalss

  • Author

    Shanigin, V.Y. ; Yafarov, R.K.

  • Author_Institution
    Saratov Branch, Kotel´nikov Inst. of Radioeng. & Electron., Saratov, Russia
  • fYear
    2012
  • fDate
    19-20 Sept. 2012
  • Firstpage
    395
  • Lastpage
    401
  • Abstract
    Dependences of density of insular nanoeducations on temperature of sedimentation of submonolayer carbon coverings on silicon (100) crystals in the microwave plasma of fumes ethanol after a preliminary micromachining of plates in CF4 plasma and argon are investigated. It is established that after plasma micromachining in freon superficial density it is less, than after processing in argon, and they increase with temperature growth for freon and decreases for argon. It is shown that such nature of dependences testifies to existence of a precursor chemisorptions and is caused by various power of adsorption of carbon on the plates of the silicon which have passed preliminary micromachining in various chemically active environments.
  • Keywords
    adsorption; carbon; chemisorption; elemental semiconductors; micromachining; microwave materials processing; monolayers; plasma deposition; sedimentation; silicon; C; Si; adsorption; atomic mechanism; chemically active environments; freon superficial density; fume ethanol; insular nanoeducation; microwave vacuum plasma deposition; plasma micromachining; precursor chemisorptions; sedimentation temperature; silicon (100) crystals; submonolayer carbon; temperature growth; Adsorption;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
  • Conference_Location
    Saratov
  • Print_ISBN
    978-1-4673-2096-2
  • Type

    conf

  • DOI
    10.1109/APEDE.2012.6478089
  • Filename
    6478089