• DocumentCode
    3537298
  • Title

    Identification of many-core systems-on-chip with input and output noises

  • Author

    Diversi, Roberto ; Tilli, Andrea ; Bartolini, Andrea ; Benini, Luca

  • Author_Institution
    Dept. of Electr., Electron. & Inf. Eng. Guglielmo Marconi (DEI), Univ. of Bologna, Bologna, Italy
  • fYear
    2013
  • fDate
    10-13 Dec. 2013
  • Firstpage
    6481
  • Lastpage
    6488
  • Abstract
    Dynamic optimization of computing performance under thermal constraints is expected to be a cornerstone in next generation many-core systems-on-chip. Toward this goal, compact, scalable and accurate thermal models are crucial. In this work, a two-step identification procedure is presented to derive a set of local, yet interconnected, thermal models which are suitable for distributed control. The case of very noisy temperature measurement available on each core is considered, as it is the most commonly encountered in real-life multicore chips. The first identification step is based on a MISO Frisch scheme to deal with both input and output noises. Then, exploiting physical insight on the characteristics of measurement noises, a second ad-hoc procedure is proposed to refine the identified model. The proposed solution has been successfully applied to an Intel´s Single-chip-Cloud-Computer (SCC), a prototype with 48 cores.
  • Keywords
    distributed control; dynamic programming; identification; measurement errors; measurement uncertainty; multiprocessing systems; system-on-chip; temperature measurement; thermal management (packaging); Intel single-chip-cloud-computer; MISO Frisch scheme; SCC; distributed control; dynamic optimization; input noise; many-core systems-on-chip identification; measurement noises; multicore chips; noisy temperature measurement; output noise; thermal models; Computational modeling; Noise; Noise measurement; Temperature measurement; Thermal sensors; Tiles; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2013 IEEE 52nd Annual Conference on
  • Conference_Location
    Firenze
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-4673-5714-2
  • Type

    conf

  • DOI
    10.1109/CDC.2013.6760915
  • Filename
    6760915